Event Abstract

Voltage Between Electrodes As A Key Parameter In Assessing The Effect Of Oscillating Field Stimulation In Rat Spinal Cord

  • 1 Chinese Acadamy of Science, Institute of electrical engineering, China
  • 2 The graduate university of Chinese Academy of Sciences, China

The regeneration of injured spinal cord in applied weak DC electrical field has been demonstrated for years. However, an easy way to assess the treatment effect is absent because the mechanism of axonal regeneration in applied DC electrical field is unknown exactly. This paper used finite element method to analyze the voltage between stimulating electrodes in different spinal cord conditions. Moreover, we improved the implantable oscillating field stimulator (OFS) to make it more reliable, effective and steady. In animal experiment, voltages between stimulating electrodes have been successfully recorded in different conditions such as intact, injured, exposing spinal column and suturing skin. Simulation results showed that the voltage between stimulating electrodes would change in different degrees of injury. Experimental results indicated that voltages between stimulating electrodes would increase in deed because of transection of spinal cord.

Keywords: assessment of curative effect, Oscillating field stimulation, spinal cord injury

Conference: 2nd International Conference on NeuroProsthetic Devices (ICNPD-2010), Beijing , China, 27 Feb - 28 Feb, 2010.

Presentation Type: Oral Presentation

Topic: Signal processing and modeling in neuroprosthetics

Citation: Pan S, Zhang G, Huo X and Song T (2010). Voltage Between Electrodes As A Key Parameter In Assessing The Effect Of Oscillating Field Stimulation In Rat Spinal Cord. Front. Neurosci. Conference Abstract: 2nd International Conference on NeuroProsthetic Devices (ICNPD-2010). doi: 10.3389/conf.fnins.2010.09.00021

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Received: 14 Apr 2010; Published Online: 14 Apr 2010.

* Correspondence: Suying Pan, Chinese Acadamy of Science, Institute of electrical engineering, Beijing, China, huoxl@mail.iee.ac.cn