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Original Research ARTICLE Provisionally accepted The full-text will be published soon. Notify me

Front. Mater. | doi: 10.3389/fmats.2018.00076

Magnetic field induced surface micro-deformation of Magnetorheological Elastomers for roughness control

 Shiwei Chen1*, Rui Li2*, Xi Li2 and Xiaojie Wang3*
  • 1Chongqing University of Science and Technology, China
  • 2Chongqing University of Posts and Telecommunications, China
  • 3Institute of Applied Technology, Hefei Institutes of Physical Science (CAS), China

We proposed a mesoscopic model to investigate the surface micro structures of magnetorheological elastomers (MREs) under a magnetic field. By comparing the surface roughness changes of MREs, we found that the surface micro-deformation of MREs, not the field-induced hardness, mainly accounts for the controllable friction characteristics of MREs. The results also demonstrate that the field-induced friction of MREs depends on the particle contents as well as the initial surface roughness. The model predicts that the maximum relative roughness change of MREs occurs at which the MRE having particle volume fraction of around 9%, which is validated by experimental results.

Keywords: MRE;, Magnetostrictive;, roughness controling, tunable interface;, magneto induced deformation

Received: 21 May 2018; Accepted: 05 Dec 2018.

Edited by:

Norman M. Wereley, University of Maryland, College Park, United States

Reviewed by:

Xufeng Dong, Dalian University of Technology (DUT), China
Xiaomin Dong, Chongqing University, China  

Copyright: © 2018 Chen, Li, Li and Wang. This is an open-access article distributed under the terms of the Creative Commons Attribution License (CC BY). The use, distribution or reproduction in other forums is permitted, provided the original author(s) and the copyright owner(s) are credited and that the original publication in this journal is cited, in accordance with accepted academic practice. No use, distribution or reproduction is permitted which does not comply with these terms.

* Correspondence:
Dr. Shiwei Chen, Chongqing University of Science and Technology, Chongqing, China,
Mr. Rui Li, Chongqing University of Posts and Telecommunications, Chongqing, China,
Mr. Xiaojie Wang, Institute of Applied Technology, Hefei Institutes of Physical Science (CAS), Hefei, China,