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CORRECTION article

Front. Mol. Biosci., 18 August 2021
Sec. Structural Biology
Volume 8 - 2021 | https://doi.org/10.3389/fmolb.2021.749448

Corrigendum: Protein and Organic-Molecular Crystallography with 300kV Electrons on a Direct Electron Detector

www.frontiersin.orgKiyofumi Takaba1 www.frontiersin.orgSaori Maki-Yonekura1 www.frontiersin.orgSatoru Inoue2 www.frontiersin.orgTatsuo Hasegawa2 www.frontiersin.orgKoji Yonekura1,3,4*
  • 1Biostructural Mechanism Laboratory, RIKEN SPring-8 Center, Sayo, Japan
  • 2Department of Applied Physics, The University of Tokyo, Tokyo, Japan
  • 3Advanced Electron Microscope Development Unit, RIKEN-JEOL Collaboration Center, RIKEN Baton Zone Program, Sayo, Japan
  • 4Institute of Multidisciplinary Research for Advanced Materials, Tohoku University, Sendai, Japan

A corrigendum on
Protein and Organic-Molecular Crystallography With 300kV Electrons on a Direct Electron Detector

by Takaba, K., Maki-Yonekura, S., Inoue, S., Hasegawa, T., and, Yonekura, K (2021). Front. Mol. Biosci. 7:612226. doi: 10.3389/fmolb.2020.612226

In the original article, there was an error in the Summary and Perspectives. It was indicated that radiation damage caused by single 300 kV electron is reduced to 96 and 25%, compared with 100 and 200 kV, respectively. In fact, the correct values are by 49 and 20%. A correction has been made to the Summary and Perspectives section, paragraph 2.

“Radiation damage is serious in both X-ray analysis and cryo-EM, and previous studies observed that even a small amount of electron irradiation caused breaks of cysteine bonds (Hattne et al., 2018, 2019) and reduction of metal (Yonekura et al., 2015) in protein crystals. The radiation damage caused by single 300 kV electron is reduced by 49 and 20%, compared with 100 and 200 kV, respectively (Yonekura et al., 2019). Deposited energy with single 300 kV electron/Å2 was calculated to 5.6 × 106 Gy (J/kg) for water (ICRU, 2014; Yonekura et al., 2019), where Gy is a standard unit in X-ray crystallography and related areas. Henderson limit, a criterion for a tolerable energy deposition on biological samples and widely used in X-ray crystallography, is ∼2 × 107 Gy (Henderson, 1990). The catalase structure here was obtained from a maximum exposure of 3.5 × 106 M Gy for single dataset (Table 1), and this is 1/5.7 of Hendrson limit. Thus, our system would be suitable for electron 3D crystallography with less damaging, a smaller point spread, and less noise than using the scintillator coupled camera.”

The authors apologize for this error and state that this does not change the scientific conclusions of the article in any way. The original article has been updated.

Publisher’s Note

All claims expressed in this article are solely those of the authors and do not necessarily represent those of their affiliated organizations, or those of the publisher, the editors and the reviewers. Any product that may be evaluated in this article, or claim that may be made by its manufacturer, is not guaranteed or endorsed by the publisher.

Keywords: DE64, energy filter, electron 3D crystallography (3D ED/MicroED), eEFD, CRYO ARM

Citation: Takaba K, Maki-Yonekura S, Inoue S, Hasegawa T and Yonekura K (2021) Corrigendum: Protein and Organic-Molecular Crystallography with 300kV Electrons on a Direct Electron Detector. Front. Mol. Biosci. 8:749448. doi: 10.3389/fmolb.2021.749448

Received: 29 July 2021; Accepted: 05 August 2021;
Published: 18 August 2021.

Edited and reviewed by:

Dan Shi, Center for Cancer Research, United States

Copyright © 2021 Takaba, Maki-Yonekura, Inoue, Hasegawa and Yonekura. This is an open-access article distributed under the terms of the Creative Commons Attribution License (CC BY). The use, distribution or reproduction in other forums is permitted, provided the original author(s) and the copyright owner(s) are credited and that the original publication in this journal is cited, in accordance with accepted academic practice. No use, distribution or reproduction is permitted which does not comply with these terms.

*Correspondence: Koji Yonekura, yone@spring8.or.jp

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