Research Topic

Advanced Characterization Techniques of Oxide Quantum Functional Materials

About this Research Topic

Due to their unique chemical and physical properties, oxide quantum functional materials have broad application prospects in information storage, quantum technology, energy catalysis and other fields. With the rapid development of advanced materials synthesis and characterization methods, it has become possible to study and utilize the surface and interface properties of functional oxide materials at the atomic scale. The oxide quantum functional materials could exhibit new functions or quantum states that are fundamentally different from the corresponding bulk by introducing strain, symmetry breaking and dimension control on the atomic scale surface and interface. These emergent phenomena, which defy the predictions of classical theory, are the key to realizing the unique functions of emerging quantum materials. The novel physical and chemical properties of these materials are determined by the crystal structure and electronic structure at the surface and interface. Advanced characterization techniques, especially the rapid development of extremely bright synchrotron radiation light sources, are one of the powerful tools to characterize them. In addition, the development of various in situ experimental methods has brought new opportunities to oxide quantum functional materials and are expected to resolve some bottleneck problems encountered at present.

To a large extent, the novel properties of oxide quantum functional materials come from the coupling between the degrees of freedom such as spin, charge, orbit and lattice. This Research Topic aims to provide a platform for researchers to share their new concepts, new techniques and new results of the interaction between these degrees of freedom in oxide quantum functional materials using advanced characterization techniques, and to provide guidance for future development.

We welcome submissions of Original Research, Reviews and Mini Reviews covering the following research areas:
• Controlled preparation of functional oxides, including thin films, nanoparticles, and ceramics
• Advanced characterization of crystal structure and electronic structure
• In situ experiments under external fields, such as optical, thermal, magnetic, electric field, etc
• Synchrotron radiation characterization techniques, including HRXRD, GIXRD, XAS, XMCD/XMLD, etc
• Advanced surface and interface characterization and analysis, including STM, AFM, SEM, TEM, etc.
• Novel properties of oxide quantum functional materials, such as multiferroic, ferroelectric/ferromagnetic, catalysis, etc.


Keywords: Synchrotron X-ray technique, functional oxides, advanced characterization, X-ray diffraction and absorption, in situ experiment


Important Note: All contributions to this Research Topic must be within the scope of the section and journal to which they are submitted, as defined in their mission statements. Frontiers reserves the right to guide an out-of-scope manuscript to a more suitable section or journal at any stage of peer review.

Due to their unique chemical and physical properties, oxide quantum functional materials have broad application prospects in information storage, quantum technology, energy catalysis and other fields. With the rapid development of advanced materials synthesis and characterization methods, it has become possible to study and utilize the surface and interface properties of functional oxide materials at the atomic scale. The oxide quantum functional materials could exhibit new functions or quantum states that are fundamentally different from the corresponding bulk by introducing strain, symmetry breaking and dimension control on the atomic scale surface and interface. These emergent phenomena, which defy the predictions of classical theory, are the key to realizing the unique functions of emerging quantum materials. The novel physical and chemical properties of these materials are determined by the crystal structure and electronic structure at the surface and interface. Advanced characterization techniques, especially the rapid development of extremely bright synchrotron radiation light sources, are one of the powerful tools to characterize them. In addition, the development of various in situ experimental methods has brought new opportunities to oxide quantum functional materials and are expected to resolve some bottleneck problems encountered at present.

To a large extent, the novel properties of oxide quantum functional materials come from the coupling between the degrees of freedom such as spin, charge, orbit and lattice. This Research Topic aims to provide a platform for researchers to share their new concepts, new techniques and new results of the interaction between these degrees of freedom in oxide quantum functional materials using advanced characterization techniques, and to provide guidance for future development.

We welcome submissions of Original Research, Reviews and Mini Reviews covering the following research areas:
• Controlled preparation of functional oxides, including thin films, nanoparticles, and ceramics
• Advanced characterization of crystal structure and electronic structure
• In situ experiments under external fields, such as optical, thermal, magnetic, electric field, etc
• Synchrotron radiation characterization techniques, including HRXRD, GIXRD, XAS, XMCD/XMLD, etc
• Advanced surface and interface characterization and analysis, including STM, AFM, SEM, TEM, etc.
• Novel properties of oxide quantum functional materials, such as multiferroic, ferroelectric/ferromagnetic, catalysis, etc.


Keywords: Synchrotron X-ray technique, functional oxides, advanced characterization, X-ray diffraction and absorption, in situ experiment


Important Note: All contributions to this Research Topic must be within the scope of the section and journal to which they are submitted, as defined in their mission statements. Frontiers reserves the right to guide an out-of-scope manuscript to a more suitable section or journal at any stage of peer review.

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Submission Deadlines

30 September 2021 Abstract
31 January 2022 Manuscript

Participating Journals

Manuscripts can be submitted to this Research Topic via the following journals:

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Topic Editors

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Submission Deadlines

30 September 2021 Abstract
31 January 2022 Manuscript

Participating Journals

Manuscripts can be submitted to this Research Topic via the following journals:

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