About this Research Topic
Optical sensing technology is attracting increasing attention for its various kinds of applications in environmental detection, industrial process control, agricultural monitoring, and medical diagnose. In the past decades, light sources covering the wavelength from ultraviolet (UV) to terahertz (THz) region have been developed and applied to the optical detection. Recent breakthroughs on light sources including light-emitting diodes, semiconductor lasers, solid-state lasers, quantum cascade lasers, interband cascade lasers result in higher detection sensitivity and more compact sensing systems, moving the optical sensing technologies into a new stage. The past decades have witnessed a booming development in optical sensors, which benefit from the novel light sources and novel sensor structures.
The goal of this Research Topic is to report the most recent advances and developments in novel optical methods, devices, and technologies. Evaluation metrics such as detection sensitivity, selectivity, robustness, sensor structure, instrument portability, and price, etc. will be discussed in the Research Topic. Enhancement by optical fibers, plasmonics, nanomaterials, and microelectromechanical systems will also be presented to improve the optical sensing performance. The optical sensing technology in physical, chemical, and biological research will also be discussed in this Research Topic to review its recent advances in various applications.
The purpose of this Research Topic is to report the recent progress and trends in optical sensing technology. The Research Topic calls for manuscript submissions discussing theory, experimental results as well as applications covering UV to THz region. The Research Topic generally includes Original Research, Reviews, and Perspective articles on microscopy, nonlinear optics, optoelectronics, physical optics, spectroscopy, optical sensors, measurements, and metrology.
Keywords: optical sensing, optical detection, terahertz, UV, microscopy, nonlinear optics, optoelectronics, metrology
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