Polarization is a fundamental property of light waves. Polarization information of the light interacted with an object can be used to reveal its physical properties of interest, such as material, surface features, shape, roughness, refractive index, optical constants, thickness, etc. Polarimetry is the technique for measuring and interpreting polarization information, and ellipsometry usually refers to the polarimetry that characterizes thin films and surfaces using polarization changes. Due to the significance and unique advantages of polarization information, polarimetry and ellipsometry have promising applications in several fields, including target detection, remote sensing, biomedical imaging, astronomical observations, characterization of surfaces and thin films, optical communication, etc. Driven by the growing needs of polarimetry and ellipsometry, the theory, instrument, and polarization information interpretation for polarimetry and ellipsometry are constantly developing.
Although great progress has been made, improving the performance of polarimetry and ellipsometry, exploring the applications of polarimetry and ellipsometry, and strengthening the theory of polarization are still in need to address the challenges and to expand the potential.
The main goal of this Research Topic is to provide a specialized platform for researchers dedicated to this field where they can share their important discoveries, theoretical and experimental advances, technical breakthroughs, methodological innovations, application developments, viewpoints, and perspectives to the community of polarimetry and ellipsometry.
In this Research Topic, authors are welcomed to contribute submissions of Original Research, Review, Mini-Review, and Perspective articles in the themes including but not limited to:
1. Polarimetry methods and systems
2. Ellipsometry methods and systems
3. Methods and systems of polarimetric imaging and spectroscopy
4. Applications of polarimetry, ellipsometry and polarimetric imaging
5. Fundamentals of Mueller matrix and Stokes vector
6. Optical imaging, sensing and communication based on the polarization information
Polarization is a fundamental property of light waves. Polarization information of the light interacted with an object can be used to reveal its physical properties of interest, such as material, surface features, shape, roughness, refractive index, optical constants, thickness, etc. Polarimetry is the technique for measuring and interpreting polarization information, and ellipsometry usually refers to the polarimetry that characterizes thin films and surfaces using polarization changes. Due to the significance and unique advantages of polarization information, polarimetry and ellipsometry have promising applications in several fields, including target detection, remote sensing, biomedical imaging, astronomical observations, characterization of surfaces and thin films, optical communication, etc. Driven by the growing needs of polarimetry and ellipsometry, the theory, instrument, and polarization information interpretation for polarimetry and ellipsometry are constantly developing.
Although great progress has been made, improving the performance of polarimetry and ellipsometry, exploring the applications of polarimetry and ellipsometry, and strengthening the theory of polarization are still in need to address the challenges and to expand the potential.
The main goal of this Research Topic is to provide a specialized platform for researchers dedicated to this field where they can share their important discoveries, theoretical and experimental advances, technical breakthroughs, methodological innovations, application developments, viewpoints, and perspectives to the community of polarimetry and ellipsometry.
In this Research Topic, authors are welcomed to contribute submissions of Original Research, Review, Mini-Review, and Perspective articles in the themes including but not limited to:
1. Polarimetry methods and systems
2. Ellipsometry methods and systems
3. Methods and systems of polarimetric imaging and spectroscopy
4. Applications of polarimetry, ellipsometry and polarimetric imaging
5. Fundamentals of Mueller matrix and Stokes vector
6. Optical imaging, sensing and communication based on the polarization information
