ORIGINAL RESEARCH article

Front. Electron. Mater

Sec. Superconducting Materials

Volume 5 - 2025 | doi: 10.3389/femat.2025.1572940

This article is part of the Research TopicUnveiling Strongly Correlated Materials with Resonant Inelastic X-ray ScatteringView all 4 articles

Characterizing sample degradation from synchrotron based X-ray measurements of ultra-thin exfoliated flakes

Provisionally accepted
Michael  F. DiScalaMichael F. DiScala1Bjarke  S. JessenBjarke S. Jessen2,3Valerie  HsiehValerie Hsieh2Yanhong  GuYanhong Gu4Daniel  J. RizzoDaniel J. Rizzo2Jacob  M. AmontreeJacob M. Amontree2Xingzhou  YanXingzhou Yan2Qiaochu  WangQiaochu Wang1Maelle  KapferMaelle Kapfer2Taehun  KimTaehun Kim4Michael  GeiwitzMichael Geiwitz5Gabriel  NataleGabriel Natale5Jonathan  PelliciariJonathan Pelliciari4James  C. HoneJames C. Hone2Ken  S. BurchKen S. Burch5Dimitri  N. BasovDimitri N. Basov2Cory  R. DeanCory R. Dean2*Valentina  BisogniValentina Bisogni4*Kemp  W. PlumbKemp W. Plumb1*
  • 1Brown University, Providence, United States
  • 2Columbia University, New York City, New York, United States
  • 3Technical University of Denmark, Kongens Lyngby, Denmark
  • 4National Synchrotron Light Source II, Brookhaven National Laboratory (DOE), Upton, New York, United States
  • 5Boston College, Chestnut Hill, Massachusetts, United States

The final, formatted version of the article will be published soon.

It is undeniable that novel 2D devices and heterostructures will have a lasting impact on the advancement of future technologies. However, the inherent instability of many exfoliated van der Waals (vdW) materials is a well-known hurdle yet to be overcome. Thus, the sustained interest in exfoliated vdW materials underscores the importance of understanding the mechanisms of sample degradation to establish proactive protective measures. Here, the impact of prolonged synchrotronbased X-ray beam exposure on exfoliated flakes of two contemporary vdW materials, NiPS3 and α-RuCl3, is explored using resonant inelastic X-ray scattering (RIXS) and total fluorescence yield X-ray absorption spectroscopy (XAS). In NiPS3, the resulting RIXS and XAS spectra show a suppression, then vanishing, of NiS6 multiplet excitations coupled with an upward shift of the peak energy of the XAS as a function of X-ray dose. In α-RuCl3, the signs of beam damage from the RIXS spectra are less evident. However, the post-experiment characterization of both materials using Raman spectroscopy exhibits signals of an amorphous and disordered system compared to pristine flakes; in addition, energy-dispersive X-ray spectroscopy of NiPS3 shows evidence of ligand vacancies. As synchrotron radiation is fast becoming a required probe to study 2D vdW materials, these findings lay the groundwork for the development of future protective measures for synchrotronbased prolonged X-ray beam exposure, as well as for X-ray free electron laser.

Keywords: resonant inelastic soft X-ray scattering (RIXS), 2D magnetism, Magnetism - prospects, van der Waals (vdW), NiPS3, RuCl3, Graphene

Received: 07 Feb 2025; Accepted: 14 May 2025.

Copyright: © 2025 DiScala, Jessen, Hsieh, Gu, Rizzo, Amontree, Yan, Wang, Kapfer, Kim, Geiwitz, Natale, Pelliciari, Hone, Burch, Basov, Dean, Bisogni and Plumb. This is an open-access article distributed under the terms of the Creative Commons Attribution License (CC BY). The use, distribution or reproduction in other forums is permitted, provided the original author(s) or licensor are credited and that the original publication in this journal is cited, in accordance with accepted academic practice. No use, distribution or reproduction is permitted which does not comply with these terms.

* Correspondence:
Cory R. Dean, Columbia University, New York City, 10027, New York, United States
Valentina Bisogni, National Synchrotron Light Source II, Brookhaven National Laboratory (DOE), Upton, 11973-5000, New York, United States
Kemp W. Plumb, Brown University, Providence, United States

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