REVIEW article

Front. Nanotechnol.

Sec. Nanometrology

Volume 7 - 2025 | doi: 10.3389/fnano.2025.1559523

This article is part of the Research TopicThought Leaders in Nanotechnology ResearchView all 5 articles

Computational methods in nanometrology: The challenges of resolution and stochasticity

Provisionally accepted
  • Institute of Nanoscience and Nanotechnology, National Centre of Scientific Research Demokritos, Athens, Greece

The final, formatted version of the article will be published soon.

Nanometrology is vital for the advancement of nanotechnology but faces significant computational demands due to the complexity of measurements at the nanoscale. This review identifies two primary challenges: first, achieving super-resolution in microscopy imaging, where capturing detailed nanoscale information over large areas is handled with various strategies; second, characterizing the stochastic nature of nanostructure morphologies, which requires advanced methods to accurately analyze random and disordered features. We examine the limitations of existing image enhancement techniques and explore computational strategies for analyzing both discrete and continuous nanostructured surfaces. Addressing these challenges emphasizes the critical need for developing new computational methods to enhance precision and reliability in nanoscale measurements, thereby fostering continued innovation in nanotechnology.

Keywords: Resolution, Fourier Analysis, stochasticity, roughness, Point patterns, fractal, multifractal, spatial complexity

Received: 13 Jan 2025; Accepted: 09 May 2025.

Copyright: © 2025 Kondi, Papia, Stai and Constantoudis. This is an open-access article distributed under the terms of the Creative Commons Attribution License (CC BY). The use, distribution or reproduction in other forums is permitted, provided the original author(s) or licensor are credited and that the original publication in this journal is cited, in accordance with accepted academic practice. No use, distribution or reproduction is permitted which does not comply with these terms.

* Correspondence: Vassilios Constantoudis, Institute of Nanoscience and Nanotechnology, National Centre of Scientific Research Demokritos, Athens, Greece

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