Affiliations 1 and 2 were numbered incorrectly as 1Department of Electronics Engineering, Indian Institute of Technology (ISM), Dhanbad, Jharkhand, India, 2School of Engineering, Centre for Electronics Frontiers, Integrated Micro and Nano Systems, The University of Edinburgh, Edinburgh, Scotland, United Kingdom. The correct affiliations appear above. The original version of this article has been updated.
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Publisher’s note
All claims expressed in this article are solely those of the authors and do not necessarily represent those of their affiliated organizations, or those of the publisher, the editors and the reviewers. Any product that may be evaluated in this article, or claim that may be made by its manufacturer, is not guaranteed or endorsed by the publisher.
Summary
Keywords
memristive devices, oxide materials, performance matrix, atomic layer deposition, variability factor, device stability
Citation
Kumar S, Yadav D, Stathopoulos S and Prodromakis T (2025) Correction: Performance and variability analysis of ALD-grown wafer scale HfO2/Ta2O5-based memristive devices for neuromorphic computing. Front. Nanotechnol. 7:1650174. doi: 10.3389/fnano.2025.1650174
Received
19 June 2025
Accepted
20 June 2025
Published
26 June 2025
Approved by
Frontiers Editorial Office, Frontiers Media SA, Switzerland
Volume
7 - 2025
Updates
Copyright
© 2025 Kumar, Yadav, Stathopoulos and Prodromakis.
This is an open-access article distributed under the terms of the Creative Commons Attribution License (CC BY). The use, distribution or reproduction in other forums is permitted, provided the original author(s) and the copyright owner(s) are credited and that the original publication in this journal is cited, in accordance with accepted academic practice. No use, distribution or reproduction is permitted which does not comply with these terms.
*Correspondence: Sanjay Kumar, sanjaysihag91@gmail.com; Themis Prodromakis, t.prodromakis@ed.ac.uk
Disclaimer
All claims expressed in this article are solely those of the authors and do not necessarily represent those of their affiliated organizations, or those of the publisher, the editors and the reviewers. Any product that may be evaluated in this article or claim that may be made by its manufacturer is not guaranteed or endorsed by the publisher.