Deep Learning for Computer Vision and Measurement Systems

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About this Research Topic

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Background

Deep learning has transformed the landscape of computer vision, enabling breakthroughs in tasks such as image classification, object detection, and scene understanding. Similarly, measurement systems, critical in industries like manufacturing, robotics, and healthcare, benefit from advanced techniques for precise, automated data collection and analysis. The integration of deep learning into these domains promises to enhance accuracy, speed, and adaptability. By combining computer vision with measurement systems, deep learning can drive significant improvements in areas such as defect detection, quality assurance, and 3D reconstruction, leading to smarter, more efficient industrial processes and technologies.

The primary objective of this research is to explore how deep learning can be harnessed to enhance the capabilities of both computer vision and measurement systems, as well as their integration. Traditional measurement systems often struggle with challenges like environmental variability, complex object detection, and the need for real-time performance. This research will address these challenges by investigating novel deep learning approaches or improving existing algorithms to enhance system robustness, accuracy, and computational efficiency. The ultimate goal is to enable high-performing solutions in diverse applications such as automated inspection, autonomous systems, and medical imaging, where both precise visual data and accurate measurements are essential.

This Research Topic invites contributions on three key themes: deep learning for computer vision, deep learning for measurement systems, and the integration of deep learning into both fields. Topics of interest include but are not limited to:

- Visual inspection and defect detection
- 3D measurement and reconstruction
- Sensor fusion in measurement systems
- Real-time processing for industrial and autonomous applications
- Image compression using deep learning techniques
- Object detection and segmentation in dynamic environments
- AI-driven quality control in manufacturing
- Deep learning-based calibration and alignment in measurement systems
- Super-resolution and image enhancement for measurement accuracy
- Transfer learning for improving computer vision and measurement tasks
- Deep learning for multi-view and multi-sensor systems
- Self-supervised and unsupervised learning for vision-based measurement systems
- Data augmentation and synthetic data generation for measurement tasks
- Explainability and interpretability in deep learning for measurement systems
- Domain adaptation and generalization for cross-industry applications

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This Research Topic accepts the following article types, unless otherwise specified in the Research Topic description:

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  • FAIR² Data
  • General Commentary
  • Hypothesis and Theory
  • Methods

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Keywords: Deep learning, Machine Learning, Image Processing, Computer vision, Measurement Systems

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