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2 Publications

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Original Research

Accepted on 14 May 2025

Characterizing sample degradation from synchrotron based X-ray measurements of ultra-thin exfoliated flakes

Michael F. DiScala
Bjarke S. Jessen
Valerie Hsieh
Yanhong Gu
Daniel J. Rizzo
Jacob M. Amontree
Xingzhou Yan
Qiaochu Wang
Maelle Kapfer
Taehun Kim

Frontiers in Electronic Materials

doi 10.3389/femat.2025.1572940

250 views

Mini Review

Published on 06 Feb 2025

Excitonic insulator candidate Ta2NiSe5 and related transition-metal compounds studied by resonant inelastic x-ray scattering

Takashi Mizokawa
Claude Monney

Frontiers in Electronic Materials

doi 10.3389/femat.2025.1456147

837 views