YK
yuya kajikawa
The University of Tokyo
Bunkyo, Japan
Specialty Chief Editor
Patent Analytics
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Specialty Chief Editor
Associate Editors
DH
dong huo
Harbin Institute of Technology, Shenzhen
Shenzhen, China
Associate Editor
Patent Analytics
WK
wonjoon kim
Korea Advanced Institute of Science and Technology (KAIST)
Daejeon, Republic of Korea
Associate Editor
Patent Analytics
AM
antonio messeni petruzzelli
Politecnico di Bari
Bari, Italy
Associate Editor
Patent Analytics
HS
hsin-ning su
National Chiao Tung University
Hsinchu, Taiwan
Associate Editor
Patent Analytics
AS
arho suominen
VTT Technical Research Centre of Finland Ltd
Espoo, Finland
Associate Editor
Patent Analytics
Review Editors
MB
massimo barbieri
Polytechnic University of Milan
Milan, Italy
Review Editor
Patent Analytics
IB
irena bates
University of Zagreb
Zagreb, Croatia
Review Editor
Patent Analytics
EC
evangelia chalioti
Yale University
New Haven, United States
Review Editor
Patent Analytics
SC
scott cunningham
University of Strathclyde
Glasgow, United Kingdom
Review Editor
Patent Analytics
SE
scott erickson
Ithaca College
Ithaca, United States
Review Editor
Patent Analytics
AH
arash hajikhani
VTT Technical Research Centre of Finland Ltd
Espoo, Finland
Review Editor
Patent Analytics
HH
hung-chun huang
National Chi Nan University
Puli, Nantou, Taiwan
Review Editor
Patent Analytics
LK
luciano kay
University of California, Santa Barbara
Santa Barbara, United States
Review Editor
Patent Analytics
NK
namil kim
Harbin Institute of Technology
Harbin, China
Review Editor
Patent Analytics
SK
seokbeom kwon
The University of Tokyo
Bunkyo, Japan
Review Editor
Patent Analytics