yuya kajikawa
Tokyo Institute of Technology
Meguro City, Japan
Specialty Chief Editor
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Specialty Chief Editor
Associate Editors
chih-hung hsieh
College of Management, Yuan Ze University
Zhong-li, Taoyuan, Taiwan
Associate Editor
Patent Analytics
dong huo
Harbin Institute of Technology, Shenzhen
Shenzhen, China
Associate Editor
Patent Analytics
wonjoon kim
Korea Advanced Institute of Science and Technology (KAIST)
Daejeon, Republic of Korea
Associate Editor
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antonio messeni petruzzelli
Politecnico di Bari
Bari, Italy
Associate Editor
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hsin-ning su
National Chiao Tung University
Hsinchu, Taiwan
Associate Editor
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arho suominen
VTT Technical Research Centre of Finland Ltd
Espoo, Finland
Associate Editor
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Review Editors
massimo barbieri
Polytechnic University of Milan
Milan, Italy
Review Editor
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irena bates
University of Zagreb
Zagreb, Croatia
Review Editor
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evangelia chalioti
Yale University
New Haven, United States
Review Editor
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nuoya chen
University of Amsterdam
Amsterdam, Netherlands
Review Editor
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yongrae cho
Science and Technology Policy Institute
Daejeon, Republic of Korea
Review Editor
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scott cunningham
University of Strathclyde
Glasgow, United Kingdom
Review Editor
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scott erickson
Ithaca College
Ithaca, United States
Review Editor
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arash hajikhani
VTT Technical Research Centre of Finland Ltd
Espoo, Finland
Review Editor
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hung-chun huang
National Chi Nan University
Puli, Nantou, Taiwan
Review Editor
Patent Analytics