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Editors
See allyuya kajikawa
The University of Tokyo
Bunkyo, Japan
Specialty Chief Editor
Patent Analytics
dong huo
Harbin Institute of Technology, Shenzhen
Shenzhen, China
Associate Editor
Patent Analytics
hsin-ning su
National Chiao Tung University
Hsinchu, Taiwan
Associate Editor
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arho suominen
VTT Technical Research Centre of Finland Ltd
Espoo, Finland
Associate Editor
Patent Analytics
