REVIEW article

Front. Sens.

Sec. Sensor Devices

Volume 6 - 2025 | doi: 10.3389/fsens.2025.1603755

This article is part of the Research TopicParticle and radiation sensors developed at INFN-CSN5View all 4 articles

ARCADIA Fully-Depleted CMOS MAPS development with LFoundry 110nm CIS

Provisionally accepted
Manuel  Da Rocha RoloManuel Da Rocha Rolo1*Stefano  DurandoStefano Durando1Fabrizio  AlfonsiFabrizio Alfonsi2A.  GabrielliA. Gabrielli2Gabriele  BalbiGabriele Balbi2Serena  MattiazzoSerena Mattiazzo3Devis  PantanoDevis Pantano3Davide  ChiapparaDavide Chiappara3Attilio  AndreazzaAttilio Andreazza4Matteo  PezzoliMatteo Pezzoli5Lodovico  RattiLodovico Ratti5Giovanni  AmbrosiGiovanni Ambrosi6Tommaso  CrociTommaso Croci6Coralie  NeubüserCoralie Neubüser7Gian-Franco  Dalla BettaGian-Franco Dalla Betta7Thomas  CorradinoThomas Corradino7Roberto  IuppaRoberto Iuppa7Ester  RicciEster Ricci7Angelo  RivettiAngelo Rivetti1Sara  GarbolinoSara Garbolino1Andrea  PaternoAndrea Paterno1Marco  MandurrinoMarco Mandurrino1Davide  FalchieriDavide Falchieri2Massimo  CacciaMassimo Caccia4Romualdo  SantoroRomualdo Santoro4Piero  GiubilatoPiero Giubilato3Jeffery  WyssJeffery Wyss3Gianluca  TraversiGianluca Traversi5Pisana  PlacidiPisana Placidi6Lucio  PancheriLucio Pancheri7
  • 1INFN, Torino, Italy
  • 2INFN, Bologna, Italy
  • 3INFN, Padova, Italy
  • 4INFN, Milano, Italy
  • 5INFN, Pavia, Italy
  • 6INFN, Perugia, Italy
  • 7INFN TIFPA, Trento, Italy

The final, formatted version of the article will be published soon.

Fully-depleted CMOS sensors represent a significant step forward in radiation detection, combining the advantages of monolithic active pixel sensors with the enhanced signal collection efficiency of depleted bulk materials. The ARCADIA Collaboration established a technology platform for the development and production of deep sub-micron fully-depleted CMOS monolithic sensors with excellent collection efficiency, advancing the semiconductor detector technology with IP cores, ASICs and back-end dedicated acquisition systems. The sensor technology was demonstrated on system-ready full chip monolithic active pixel sensors with high rate capability and very low power for the detection of charged particles and photons. Innovative CMOS monolithicLGADs featuring a shallow gain layer and implementing a low-gain avalanche diode were developed for time-of-flight detectors, while other prototype ASICs implement multi-threshold photon-counting architectures for X-ray imaging. The implementation of fully-depleted monolithic strip sensors with embedded electronics and low power density makes the proposed approach † Thomas Corradino is now with Fondazione Bruno Kessler (FBK),

Keywords: CMOS, fully-depleted monolithic sensor, ASIC, low-power architectures, Semiconductor sensors, integrated circuits, VLSI

Received: 31 Mar 2025; Accepted: 03 Jul 2025.

Copyright: © 2025 Da Rocha Rolo, Durando, Alfonsi, Gabrielli, Balbi, Mattiazzo, Pantano, Chiappara, Andreazza, Pezzoli, Ratti, Ambrosi, Croci, Neubüser, Dalla Betta, Corradino, Iuppa, Ricci, Rivetti, Garbolino, Paterno, Mandurrino, Falchieri, Caccia, Santoro, Giubilato, Wyss, Traversi, Placidi and Pancheri. This is an open-access article distributed under the terms of the Creative Commons Attribution License (CC BY). The use, distribution or reproduction in other forums is permitted, provided the original author(s) or licensor are credited and that the original publication in this journal is cited, in accordance with accepted academic practice. No use, distribution or reproduction is permitted which does not comply with these terms.

* Correspondence: Manuel Da Rocha Rolo, INFN, Torino, Italy

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