In the published article, there was an error in the Data availability statement. It was incorrectly stated that the names of the repository (and accession number) can be found in the article or Supplementary material. The correct Data Availability statement appears below.
Statements
Data availability statement
The datasets presented in this study can be found in the online repository; https://doi.org/10.6084/m9.figshare.c.7757147.v1.
The authors apologize for this error and state that this does not change the scientific conclusions of the article in any way. The original article has been updated.
Publisher’s note
All claims expressed in this article are solely those of the authors and do not necessarily represent those of their affiliated organizations, or those of the publisher, the editors and the reviewers. Any product that may be evaluated in this article, or claim that may be made by its manufacturer, is not guaranteed or endorsed by the publisher.
Summary
Keywords
antibiotic resistance, light microscopy, bacterial morphology, deep learning, bioinformatic analysis
Citation
Ikebe M, Aoki K, Hayashi-Nishino M, Furusawa C and Nishino K (2025) Corrigendum: Bioinformatic analysis reveals the association between bacterial morphology and antibiotic resistance using light microscopy with deep learning. Front. Microbiol. 16:1607769. doi: 10.3389/fmicb.2025.1607769
Received
08 April 2025
Accepted
09 April 2025
Published
17 April 2025
Approved by
Frontiers Editorial Office, Frontiers Media SA, Switzerland
Volume
16 - 2025
Updates
Copyright
© 2025 Ikebe, Aoki, Hayashi-Nishino, Furusawa and Nishino.
This is an open-access article distributed under the terms of the Creative Commons Attribution License (CC BY). The use, distribution or reproduction in other forums is permitted, provided the original author(s) and the copyright owner(s) are credited and that the original publication in this journal is cited, in accordance with accepted academic practice. No use, distribution or reproduction is permitted which does not comply with these terms.
*Correspondence: Kota Aoki, aoki.k@tottori-u.ac.jpMitsuko Hayashi-Nishino, mnishino@sanken.osaka-u.ac.jpKunihiko Nishino, nishino@sanken.osaka-u.ac.jp
‡These authors have contributed equally to this work
†Present address: Kota Aoki Department of Electrical Engineering and Computer Science, Faculty of Engineering, Tottori University, Tottori, Japan
Disclaimer
All claims expressed in this article are solely those of the authors and do not necessarily represent those of their affiliated organizations, or those of the publisher, the editors and the reviewers. Any product that may be evaluated in this article or claim that may be made by its manufacturer is not guaranteed or endorsed by the publisher.