ORIGINAL RESEARCH article

Front. Phys.

Sec. Interdisciplinary Physics

Volume 13 - 2025 | doi: 10.3389/fphy.2025.1581519

Fractional-Order Photo-Thermoelastic Wave Propagation in Double-Porosity Semiconductor Media with Memory-Dependent and Decaying Heat Source

Provisionally accepted
Kh.  LotfyKh. Lotfy1,2*Saurav  SharmaSaurav Sharma2Imed  BacharImed Bachar2Ibrahim  S ElshazlyIbrahim S Elshazly2Eslam  ElidyEslam Elidy2Ramdan  S TantawiRamdan S Tantawi2
  • 1Faculty of Science, Zagazig University, Zagazig, Egypt
  • 2Zagazig University, Zagazig, Al Sharqia, Egypt

The final, formatted version of the article will be published soon.

This study develops a comprehensive theoretical framework for the propagation of photo-thermoelastic waves in a two-dimensional (2D), double-porosity semiconductor medium governed by a fractional-order generalized thermoelasticity theory. The classical Lord–Shulman (LS) model is extended through the incorporation of a Caputo-type fractional time derivative in the heat conduction equation, capturing memory-dependent and nonlocal thermal effects absent in traditional models. The coupled system of equations accounts for mechanical deformation, temperature variations, and photoexcitation-induced carrier dynamics under a linearized regime. The analysis is conducted in a 2D elastic half-space, with spatial and temporal field variables governed by harmonic wave assumptions. The resulting fractional differential system is solved using the normal mode method, yielding analytical expressions for the main physical fields. Numerical simulations using silicon material parameters are presented to explore the effects of fractional order, decay parameters on wave propagation characteristics. Results reveal that the fractional-order model significantly alters wave speed and stress distribution, underscoring the critical role of memory effects and double-porosity architecture in next-generation semiconductor applications.

Keywords: Fractional thermoelasticity, Caputo derivative, Photo-thermoelastic waves, Double porosity, Semiconductors, Memory-dependent heat flux

Received: 25 Feb 2025; Accepted: 05 May 2025.

Copyright: © 2025 Lotfy, Sharma, Bachar, Elshazly, Elidy and Tantawi. This is an open-access article distributed under the terms of the Creative Commons Attribution License (CC BY). The use, distribution or reproduction in other forums is permitted, provided the original author(s) or licensor are credited and that the original publication in this journal is cited, in accordance with accepted academic practice. No use, distribution or reproduction is permitted which does not comply with these terms.

* Correspondence: Kh. Lotfy, Faculty of Science, Zagazig University, Zagazig, Egypt

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