Abstract
This report focuses on current possibilities and perspectives of scanning X-ray nanodiffraction for probing nanoscale heterogeneities in silk fibers such as nanofibrils, skin-core morphologies, nanocrystalline inclusions and fine fibers down to submicron diameters.
Introduction
Progress in mimicking biological silk production and designing advanced functional materials relies on understanding silks hierarchical organization and its relation to macroscopic function. While mechanics trends across the spider phylogeny for major ampullate silks (MaS) can be deduced from protein sequence (Blackledge et al., ), detailed modeling of specific mechanical properties requires information on silks functional elements and their hierarchical organization. Here we will consider functional elements up to the nanoscale, which are accessible to X-ray scattering techniques. Indeed, β-sheet nanodomains of several nm size, embedded in an amorphous matrix of protein chains, are basic functional elements of MaS fibers observed by wide-angle X-ray scattering (WAXS) (Fraser and MacRae, ). This two-phase model is used in various molecular modeling approaches based on phenomenological or molecular dynamics approaches for simulating protein chain behavior in the amorphous phase (Termonia, ; Papadopoulos et al., ; Su and Buehler, ; Puglisi et al., ). Morphological features such as protein chain self-assembly into nanofibrils (see below) can be simulated by assuming nanodomains interconnected by pre-strained chains (Papadopoulos et al., ). Lamellar distributions of nanodomains are also obtained from bottom-up molecular dynamics simulations (Cetinkaya et al., ). Interestingly a skin-core morphology is assumed for balancing prestressed chains in the core, experimentally observed by infrared spectroscopy (Papadopoulos et al., ).
The experimental observation of nanofibrils relies principally on scattering (e.g., X-ray and neutron small-angle scattering, SAXS/SANS) and imaging (e.g., transmission electron microscopy, TEM, and others) techniques. SAXS/SANS data provide shape information but have to be transformed into real space assuming usually cylindrical objects (Yang et al., ; Sapede et al., ). For highly crystalline bagworm silk several levels of nanofibrillar assembly have been revealed (Yoshioka et al., ). The local distribution and interactions of nanoscale functional elements including skin-core morphologies cannot, however, be obtained from such studies which are usually performed on fiber bundles. X-ray microbeam diffraction (microXRD) allows probing single, μm-sized silk fibers (Riekel and Vollrath, ), paving the way for studying silks available only in small quantities (Craig, ), but has a limited reciprocal space (SAXS) resolution (see also conclusions) and cannot resolve skin-core morphologies. In contrast, high resolution imaging techniques such as transmission electron microscopy (TEM) and atomic force microscopy (AFM) allow local imaging of nanoscale functional elements from single nanofibrils to skin-core morphologies but only for very thin samples, which may require embedding, sectioning and staining. Indeed, a skin-core morphology has been revealed by TEM for Nephila's MaS fibers (Frische et al., ) and single recluse spider nanofibrils of 20 × 7 nm2 cross-section have been imaged by AFM (Wang and Schniepp, ). Arguably there is, however, insufficient knowhow on dimensional aspects, volume density and spatial distribution of nanofibrils and other nanoscale functional elements in silk fibers, limiting the development of mechanical models (Wang and Schniepp, ).
Here we will discuss the scope of scanning X-ray nanodiffraction (nanoXRD) combining bulk sensitivity with nanoscale lateral resolution. Specifically, we will provide an update on Argiope's MaS skin-core morphology (Riekel et al., ) and extend it to B. mori's cocoon silk. Radiation damage issues will be discussed for the smallest focal spots used. We will show for the case of Argiope's stabilimentum that scanning nanoXRD allows probing down to subμm diameter silk fibers and provide an outlook on R&D opportunities enabled by the ongoing upgrade of the ESRF source brightness.
Methods
NanoXRD experiments were performed at the ID13 undulator beamline at The European Synchrotron (ESRF: www.esrf.eu) (Riekel et al., ). Monochromatic focal spots of 170–180 nm fwhm (full-width-half-maximum) with a flux density of ~1.5*105 photons/s/nm2 were generated by refractive lenses (Riekel et al., ) and of 40–50 nm fwhm with a flux density of ~1.3*107 photons/s/nm2 by multilayer Laue lenses (Kubec et al., ). X-ray transparent Si3N4 membranes provide stable sample supports (Figures 1C–E) (Riekel et al., ). Local structural information is obtained by step-scanning samples through the focal spot and recording diffraction patterns in transmission geometry at each position by a single photon counting pixel detector (Dectris®) at a calibrated distance (Figures 1A,B). Typical exposure times used were 2 s for the ~180 nm and 0.1 s for the ~40 nm focal spots. The sequence of patterns obtained in a mesh-scan (Figures 1A,B) is transformed into a composite diffraction image (called here: “composite image”) corresponding to a real space projection of local reciprocal space variations. Selecting the angular range of pixels extending into the wide-angle scattering (WAXS) or small-angle X-ray scattering (SAXS) range allows visualizing atomic-scale or morphological-scale features (Riekel et al., , ).
Figure 1
Applications
NanoXRD Patterns
NanoXRD patterns for Argiope bruennichi's MaS bridge-thread with the ~180 nm focus (Riekel et al.,
Figure 2

NanoXRD patterns of silk fibers. 20 patterns were averaged for the ~180 nm focus and 201 patterns for the ~40 nm focus. (A)A. bruennichi's MaS fiber pattern for 190 nmhor × 170ver nm2 (fwhm) focus. Black vertical and horizontal lines correspond to inactive detector areas. (B) SAXS-range for ~180 nm focus. Open arrow along (meridional) fiber axis. (C) SAXS-range for ~40 nm focus; red arrow points to correlation peak at the edge of the beamstop. (D)B. mori's pattern for 50hor × 35ver nm2 (fwhm) focus. (E,F) Equatorial intensity profiles (black crosses) and fitted curves by Gaussians for Bragg/SRO peaks; 0-order polynomial for random background (Q = 2π/d; d: lattice spacing); individual Gaussians shown after subtraction of polynomial. Lower plots: differences of observed minus simulated profiles. Inactive detector areas (in red) masked for the fits. Millers indices correspond to poly(L-alanine) or poly(L-alanylglycine) lattices (Marsh et al.,
MaS Fibers
Biochemical and spectroscopic studies suggest a skin-core morphology with two proteneous and a very thin lipidic coat surrounding the core (Sponner et al.,
Figure 3

Composite images of A. bruennichi's bridge-thread based on 333 nmhor × 333 nmver raster-steps through 170 nmhor × 170 nmver (fwhm) focus. The insets show patterns from the center of the fiber. (A) Based on strongest WAXS peaks and SRO scattering. (C) Based on meridional SAXS correlation peak. (E) Based on equatorial SAXS streak. (B,D,F) Zooms of composite images to the left; red rectangles correspond to step-increments. (G) Simulation of scattering from nanofibrils in the skin-layer by cylindrical model. (H) Histogram of skin-layer cylinder diameters. Reproduced/adapted from Riekel et al. (
The smallest rod diameters for the MaS thread are observed for positions close to the inner interface of the skin-layer. Individual streaks from nanofibrils observed at this location support the suggestion of a less densely packed layer at the inner interface of the skin-layer (Frische et al.,
Evidence for a fragile glycoprotein skin-layer covering the protein coat (Sponner et al.,
Figure 4

Polyglycine-II (PG-II) nanocrystallites in MaS skin-layer. (A) Optical microscopy of thin layer (white arrow) detaching from A. bruennichi's MaS thread's surface. (B) WAXS composite image based on 500 nmhor × 1 μmver raster-steps (red rectangle) from the tip of the layer in (A) through a 190hor × 170ver nm2 (fwhm) focus. The pixels are 16× binned to enhance weak scattering. (C) Average of patterns from the composite image; positions of (100)/(101) PG-II reflections indicated. A (103) peak with d = 0.254 nm (zoom) is indicated at the edge. The limited amount of higher order PG-II reflections is due to the preferred [001] texture, reducing the probability of Bragg scattering. (D) Radial intensity profile of (C). Gaussians fitted to Bragg peaks (dotted-blue) and SRO scattering (dotted-red); 0-order polynomial fitted to random background. The calculated intensities of the PG-II (100)/(101) Bragg peaks (Crick and Rich,
Silkworm Fibers
Composite images from a B. mori bave were obtained for the ~40 nm focus. WAXS composite images based on the equatorial (210/020) and meridional (002) reflections show a homogeneous matrix as for the MaS thread (Figures 5A–D). The weak SAXS streaks are oriented normal to the fiber axis implying axially oriented nanofibrils. A slight intensity increase of the streaks is only observed at the rim (Figures 5E,F). Three nanofibrillar fractions of ±48°/0° with respect to the fiber axis in a supposedly layered morphology were deduced from AFM images of peeled, degummed B. mori fibers and correlated with WAXS data (Putthanarat et al.,
Figure 5

Composite images of B. mori bave based on 50 nmhor × 500 nmver raster-steps through a 50 nmhor × 35 nmver focus. Note that the two fibers are nearly overlapping in projection. Insets: patterns from the center of the bave. (A) Based on (210)/(020) Bragg peaks. (C) Based on the (002) Bragg peak. (E) Based on the equatorial SAXS streak. Open arrows along fiber axis. (B,D,F) Zooms of composite images to the left (distorted for better viewing). Red rectangles correspond to step-increments. (G) Pseudo line-scan across part of the bave covering the equatorial SAXS streak and the (020)/(210) peaks. The upper part of the streak is partially extinguished due to a scattering artifact (image expanded vertically by about factor 5). (H) Fit of azimuthal profile through (020) peak (inset) for pattern indicated by red arrow in (G) by Gaussian and 0-order polynomial functions. Fit by single Gaussian to the left; fit by two Gaussians with different width to the right. Inactive detector areas (in red) masked for the fits.
X-Ray Radiation Damage
X-ray radiation damage due to radicals generated from residual water molecules affects the crystallinity of unexposed neighboring scan-points in a scanning nanoXRD experiment (Riekel et al.,
Figure 6

Radiation damage effects during line-scans of A. bruennichi's MaS fiber through a ~50 nm focus. (A) Linear scans normal to fiber axis for step-increments indicated as red insets; 1 s exposure per pattern. The red line for 500 nm step-increments indicates the succession of patterns in a line-scan across the fiber. (B) Averaged patterns for each line-scan. (C) Radially integrated averaged patterns up to the 1st layer-line scaled to the maximum intensity of the (210) reflections (=1.0). (D) Variation of crystallinity (X; red stars) and particle size (L) for (020) (blue circles) and (210) (black circles) peaks as a function of step-increments. Exponential functions fitted as guides-to-the eye, assuming X = 0% for 0 nm focal spot size. L-values with 2σ error bars to the right were obtained for a 170 nm focus (Riekel et al.,
The patterns were averaged for each line-scan and integrated radially (Figures 6B,C). An increase in SRO with reduction of Bragg peak intensities is observed for 100/50 nm step-increments. This is also reflected in the variation of the crystallinity (X) and is accompanied by a reduction of the radial peak width of the equatorial reflections corresponding to a particle size (L) increase (Figure 6D). L-values for 250/500 nm step-increments correspond within errors to those obtained for a 170 nm focus (Riekel et al.,
Fine Silk Fibers
Fine silk fibers down to subμm diameters are becoming accessible to scanning nanoXRD as shown for decorating fibers composing the stabilimentum of Argiope spiders (Figure 7A) which are attributed to aciniform silk (Herberstein et al.,
Figure 7

Scanning nanoXRD of A. bruennichi's decorating fibers with 500 nmhor × 500 nmver raster-steps through a 170 nmhor × 170 nmver focus. (A) Scanning electron microscopy (SEM) image of decorating fibers (Zeiss Leo SEM: 10 KV, 10 nm sputtered gold layer). (B) WAXS composite image covering diffuse powder ring in inset-pattern; pink square: focus size; red square: step-increments (also in D,E). Inset: averaged scattering from patterns within red, open rectangle. Black arrow indicates a weak equatorial peak; open arrow along local fiber axis. (C) Equatorial WAXS profile fitted by 2 Gaussians for Bragg peaks and a 1st-order polynomial for the overall diffuse scattering. Black arrow as for inset-pattern in (B). MaS(100)/(210) positions: (Riekel et al.,
Conclusions and Outlook
The skin-core morphology of MaS fibers has been investigated by scanning nanoXRD and the presence of two proteneous layers -suggested by biochemical and spectroscopic studies (Sponner et al.,
The ESRF is currently being upgraded in the context of the “Extremely Bright Source” (EBS) project from a 3rd to a 4th generation synchrotron radiation source with an expected increase in brightness by more than an order in magnitude (Dimper et al.,
Statements
Data availability statement
All datasets generated for this study are included in the article/supplementary material.
Author contributions
All authors listed have made a substantial, direct and intellectual contribution to the work, and approved it for publication.
Acknowledgments
We thank Dr. Irina Snigireva (ESRF microimaging lab) for providing the SEM image of decorating fibers.
Conflict of interest
The authors declare that the research was conducted in the absence of any commercial or financial relationships that could be construed as a potential conflict of interest.
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Summary
Keywords
silk fibers, X-ray nanodiffraction, synchrotron radiation, skin-core structure, nanocrystallites, radiation damage
Citation
Riekel C, Burghammer M and Rosenthal M (2019) Nanoscale X-Ray Diffraction of Silk Fibers. Front. Mater. 6:315. doi: 10.3389/fmats.2019.00315
Received
20 August 2019
Accepted
20 November 2019
Published
04 December 2019
Volume
6 - 2019
Edited by
Nicola Maria Pugno, University of Trento, Italy
Reviewed by
Domenico De Tommasi, Politecnico di Bari, Italy; Dongchan Jang, Korea Advanced Institute of Science and Technology (KAIST), South Korea
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© 2019 Riekel, Burghammer and Rosenthal.
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*Correspondence: Christian Riekel riekel@esrf.fr
This article was submitted to Mechanics of Materials, a section of the journal Frontiers in Materials
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